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Modeling and simulation of stamp deflections in nanoimprint lithography: Exploiting backside grooves to enhance residual layer thickness uniformity

✍ Scribed by Hayden Taylor; Kristian Smistrup; Duane Boning


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
463 KB
Volume
88
Category
Article
ISSN
0167-9317

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