On the profile of frequency dependent di
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Z. Tekeli; M. GΓΆkΓ§en; Ε. AltΔ±ndal; S. ΓzΓ§elik; E. Γzbay
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Article
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2011
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Elsevier Science
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English
β 608 KB
The voltage (V) and frequency (f) dependence of dielectric characteristics such as dielectric constant (e 0 ), dielectric loss (e 00 ), dielectric loss tangent (tan d) and real and imaginary part of electrical modulus (V 0 and M 00 ) of the (Ni/Au)/GaN/Al 0.3 Ga 0.7 N heterostructures have been inve