✦ LIBER ✦
Modeling and parameter extraction technique from the ramp-voltage stressed I–V characteristics of thermally grown SiO2
✍ Scribed by G. Slavcheva
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 536 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0038-1101
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