✦ LIBER ✦
Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement
✍ Scribed by Ja Sun Shin; Hagyoul Bae; Euiyoun Hong; Jaeman Jang; Daeyoun Yun; Jieun Lee; Dae Hwan Kim; Dong Myong Kim
- Book ID
- 113916133
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 467 KB
- Volume
- 72
- Category
- Article
- ISSN
- 0038-1101
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