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Model of ion diffusion in synaptic cleft based on stochastical integration of langevin equation at dielectric friction approximation

✍ Scribed by Turchenkov, D. A.; Boronovsky, S. E.; Nartsissov, Ya. R.


Book ID
125392637
Publisher
SP MAIK Nauka/Interperiodica
Year
2013
Tongue
English
Weight
319 KB
Volume
58
Category
Article
ISSN
0006-3509

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