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Model-Independent X-ray Reflectivity Fitting for Structure Analysis of Poly(3-hexylthiophene) Films

✍ Scribed by Werzer, O.; Resel, R.

Book ID: 120366378
Publisher: American Chemical Society
Year: 2013
Tongue: English
Weight: 952 KB
Volume: 46
Category: Article
ISSN: 0024-9297
DOI: 10.1021/ma400147g

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