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Model for the thickness dependence of electron concentration in InN films

✍ Scribed by Cimalla, V.; Lebedev, V.; Morales, F. M.; Goldhahn, R.; Ambacher, O.

Book ID: 118063933
Publisher: American Institute of Physics
Year: 2006
Tongue: English
Weight: 450 KB
Volume: 89
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2364666

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