✦ LIBER ✦
Model for defect generation at the (1 0 0)Si/SiO2 interface during electron injection in MOS structures
✍ Scribed by M. Houssa; J.L. Autran; M.M. Heyns; A. Stesmans
- Book ID
- 108418001
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 112 KB
- Volume
- 212-213
- Category
- Article
- ISSN
- 0169-4332
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