Model-based electron microscopy: From images toward precise numbers for unknown structure parameters

✍ Scribed by S. Van Aert; W. Van den Broek; P. Goos; D. Van Dyck

• Book ID: 113800442
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 518 KB
• Volume: 43
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/j.micron.2011.10.019