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MOCVD fluorine free WSix metal gate electrode on high-k dielectric for NMOS technology

✍ Scribed by R. Gassilloud; F. Martin; C. Leroux; M. Hopstaken; X. Garros; M. Cassé; Gilles Reimbold; Thierry Billon; Daniel Bensahel


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
695 KB
Volume
86
Category
Article
ISSN
0167-9317

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