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Mo-silicided shallow junctions formed by using the ITM technique and the influence of Mo recoil atoms

✍ Scribed by T. Gessner; M. Rennau; S. Schubert; E. Vetter


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
321 KB
Volume
38
Category
Article
ISSN
0169-4332

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