𝔖 Bobbio Scriptorium
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Mixed MD simulation – analytical model analysis of Ag(111), C60 repetitive bombardment in the context of depth profiling for dynamic SIMS

✍ Scribed by Robert J. Paruch; Barbara J. Garrison; Zbigniew Postawa


Book ID
112206774
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
206 KB
Volume
45
Category
Article
ISSN
0142-2421

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