Structure and bonding in cerium oxysulfi
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C. Sourisseau; R. Cavagnat; M. Fouassier; R. Mauricot; M. Evain
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Article
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1997
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John Wiley and Sons
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English
⚖ 446 KB
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The electronic (350-900 nm), infrared and Raman (700-30 cm-1) spectra of polycrystalline samples of the mixedvalence (Ce3'/Ce4') oxysulÐde compound were investigated. The compound is a low-gap semiconductor Ce 4 O 4 S 3 with intervalence transitions in the near-infrared (ca. 850 nm) and visible (ca.