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Misorientation dependence of diffusion of Bi in [0 0 1] symmetric tilt boundaries of Cu

✍ Scribed by R. Monzen; Y. Takada; K. Kita


Book ID
110236405
Publisher
Springer
Year
1998
Tongue
English
Weight
570 KB
Volume
17
Category
Article
ISSN
0261-8028

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Stress-driven migration of symmetrical γ€ˆ
✍ Tatiana Gorkaya; Dmitri A. Molodov; GΓΌnter Gottstein πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 594 KB

Stress-induced migration of planar grain boundaries in aluminum bicrystals was measured for both low-and high-angle symmetrical h1 0 0i tilt grain boundaries across the entire misorientation range (0-90Β°). Boundary migration under a shear stress was observed to be coupled to a lateral translation of