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Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites

✍ Scribed by Hideo Kohno; Nobuhiko Ozaki; Hideto Yoshida; Koji Tanaka; Seiji Takeda


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
345 KB
Volume
38
Category
Article
ISSN
0232-1300

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