Minority Carrier Accumulation and Interfacial Kinetics in Nanosized Pt-Dotted Silicon Electrolyte Interfaces Studied by Microwave Techniques

✍ Scribed by Wünsch, F.; Nakato, Y.; Tributsch, H.

• Book ID: 120581618
• Publisher: American Chemical Society
• Year: 2002
• Tongue: English
• Weight: 116 KB
• Volume: 106
• Category: Article
• ISSN: 0022-3654
• DOI: 10.1021/jp021016+