𝔖 Bobbio Scriptorium
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Minimal cut cover of a graph with an application to the testing of electronic boards

✍ Scribed by Richard Loulou


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
339 KB
Volume
12
Category
Article
ISSN
0167-6377

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## Abstract This paper illustrates the pitfalls of the conventional heteroskedasticity and autocorrelation robust (HAR) Wald test and the advantages of new HAR tests developed by Kiefer and Vogelsang in 2005 and by Phillips, Sun and Jin in 2003 and 2006. The illustrations use the 1993 Fama–French t