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Migration of point defects at charged Cu, Ag, and Au (100) surfaces

✍ Scribed by Müller, J. E.; Ibach, H.

Book ID: 121266024
Publisher: The American Physical Society
Year: 2006
Tongue: English
Weight: 622 KB
Volume: 74
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.74.085408

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