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Mid- and near-IR ellipsometry of Y1−xPrxBa2Cu3O7 epitaxial films

✍ Scribed by J. Humlíček; K. Kamarás; J. Kircher; H.-U. Habermeier; M. Cardona; A. Röseler; J.-L. Stehlé

No coin nor oath required. For personal study only.

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