Microwave Study of ${\rm FeSe}_{0.3}{\rm Te}_{0.7}$ Thin Film by ${\rm TE}_{011}$-Mode Sapphire Dielectric Resonator

✍ Scribed by Wu, Y.; Zhou, S. Y.; Wang, X. Y.; Cao, L. X.; Zhang, X. Q.; Luo, S.; He, Y. S.; Barannik, A. A.; Cherpak, N. T.; Skresanov, V. N.

• Book ID: 118181619
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 256 KB
• Volume: 21
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/tasc.2010.2096174