Microwave noise measurement errors caused by frequency discrepancies and nonzero bandwidth

✍ Scribed by Valk, E.C.; Routledge, D.; Vaneldik, J.F.; Landecker, T.L.

• Book ID: 114542650
• Publisher: IEEE
• Year: 1993
• Tongue: English
• Weight: 577 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.245650