The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodolo
Microwave Electronics Measurement and Materials Characterization
โ Scribed by L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
- Publisher
- Wiley
- Year
- 2004
- Tongue
- English
- Leaves
- 549
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
This topic is the subject of intense research and development since microwave materials form the hardware components of the present wireless telecommunications revolution. Featuring current technology developments, this book examines every aspect of microwave material properties, measurement techniques, circuit design and application. A concise introduction to microwave theory is provided, along with an outline of the methods used to characterise microwave material properties. The authors then go on to cover both established and emerging techniques in microwave measurement in detail. Practical examples of the use of microwave materials across a range of fields, including high-speed electronics, bio-engineering, defence systems and remote sensing, are presented along with guidance on the application of microwave theory and the appropriate measurement techniques. The final chapters look ahead to the future application requirements from microwave materials and challenges in the characterisation of materials microwave properties. The authors are highly experienced in this field and combine many years of industrial and academic experience.
A valuable addition to the bookshelf of all practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. ย The authoritative approach also makes this ideal for senior students and researchers in RF and microwave engineering and microelectronics and material scientists.
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