Microtribological properties of ultrathin C60 films grown by molecular beam epitaxy

✍ Scribed by H Nakagawa; S Kibi; M Tagawa; M Umeno; N Ohmae

• Book ID: 104266441
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 223 KB
• Volume: 238
• Category: Article
• ISSN: 0043-1648
• DOI: 10.1016/s0043-1648(99)00339-7

✦ Synopsis

Ž

. Molecular beam epitaxy MBE has been applied to a condensation of thin C films with high crystallinity. In situ measurements with 60 Ž . reflection high energy electron diffraction RHEED showed an epitaxial growth of C film with a lattice constant of 1.0 nm on a MoS 60 2 Ž . Ž . substrate. Atomic force microscopy AFM and friction force microscopy FFM revealed a low friction coefficient of 0.012, the lowest value reported to date for C .