Microstructure evolution of oxidized Ni/Au ohmic contacts to p-GaN studied by X-ray diffraction

✍ Scribed by C.Y. Hu; Z.X. Qin; Z.Z. Chen; H. Yang; K. Wu; Q. Wang; Z.J. Yang; T.J. Yu; X.D. Hu; G.Y. Zhang

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 226 KB
• Volume: 8
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2004.07.004