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Microstructure characterization of precursor-derived Si-C-N ceramics before and after creep testing

✍ Scribed by Y. Cai; A. Zimmermann; A. Bauer; F. Aldinger


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
364 KB
Volume
51
Category
Article
ISSN
1359-6454

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