Microstructure and texture evolution of CeO2 buffer layers prepared via dip-coating sol–gel method on IBAD-YSZ/Hastelloy substrates

✍ Scribed by P. Du; S.S. Wang; H. Chen; Z. Wang; J.C. Sun; Z. Han; W. Schmidt; H.W. Neumuller

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 493 KB
• Volume: 463-465
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2007.05.023

✦ Synopsis

We have fabricated CeO 2 buffer layers on IBAD-YSZ/Hastelloy substrates via dip-coating sol-gel method using inorganic salts as starting materials. X-ray diffraction (XRD), scanning electron microscopy (SEM) and scanning probe microscope (SPM) were applied to investigate the influential factors in film formation and texture evolution. Flat, crack-free CeO 2 films with sharp (0 0 2) c-axis orientation and good texture were obtained by carefully controlling the precursor solution quality, dip-coating and heating process. Compared with IBAD-YSZ/Hastelloy substrates, textures of CeO 2 films were effectively improved.