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Microstructure and phase composition of ZrO2-CeO2thermal barrier coatings

✍ Scribed by K. H. Neeb


Book ID
112369520
Publisher
Springer
Year
1991
Tongue
English
Weight
138 KB
Volume
26
Category
Article
ISSN
0022-2461

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XPS investigation of impurity phase segr
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## Abstract X‐ray photoelectron spectroscopy (XPS), angular‐dependent XPS and x‐ray‐inducd Auger electron spectroscopy (XAES) have been used to investigate impurity (Si, Na and Al) segregation in 25.5 wt.% CeO~2~βˆ’2.5 Y~2~O~3~βˆ’72 ZrO~2~ plasma‐sprayed thermal barrier coatings (TBCs) as a function of