Microstructure and electrical resistivity of TiN films deposited on heated and negatively biased silicon substrates
✍ Scribed by D. Mahéo; J.-M. Poitevin
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 915 KB
- Volume
- 237
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## Abstract Growing aligned carbon nanotubes (CNTs) on electrically conducting and/or optically transparent materials is potentially useful for accessing CNT properties through electrical and optical stimuli. Here, we report a new approach to growing aligned bundles of multiwalled CNTs on a porous
Thin films of tin selenide (SnSe) were deposited on sodalime glass substrates, which were held at different temperatures in the range of 350-550 K, from the pulverized compound material using thermal evaporation method. The effect of substrate temperature (T s ) on the structural, morphological, opt