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Microstructural path model and strain dependence of recrystallisation in commercial aluminium

โœ Scribed by Vandermeer, R. A.; Wu, G. L.; Juul Jensen, D.


Book ID
126966879
Publisher
Institute of Materials, Minerals and Mining
Year
2009
Tongue
English
Weight
154 KB
Volume
25
Category
Article
ISSN
0267-0836

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Commercial purity aluminium has been cold-rolled to reductions from 40 to 99% or true thickness strains (e t ) from 0.5 to 5.0. Applying transmission electron microscopy techniques the microstructural evolution has been followed and structural parameters such as spacing between dislocation boundarie