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Microstructural parameters in electron-irradiated C108 silk fibers by wide-angle X-ray scattering studies

✍ Scribed by Sangappa; S. Asha; Ganesh Sanjeev; G. Subramanya; P. Parameswara; R. Somashekar

Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 246 KB
Volume: 115
Category: Article
ISSN: 0021-8995
DOI: 10.1002/app.31312

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