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Microstructural modifications induced by rapid thermal annealing in plasma deposited SiO[sub x]N[sub y]H[sub z] films

✍ Scribed by del Prado, A.; San Andrés, E.; Mártil, I.; González-Dı́az, G.; Bravo, D.; López, F. J.; Fernández, M.; Martı́nez, F. L.


Book ID
121509183
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
326 KB
Volume
94
Category
Article
ISSN
0021-8979

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