𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Microstructural characterization of thin SiOx films obtained by physical vapor deposition

✍ Scribed by M.A. Curiel; N. Nedev; D. Nesheva; J. Soares; R. Haasch; M. Sardela; B. Valdez; B. Sankaran; E. Manolov; I. Bineva; I. Petrov

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
652 KB
Volume
174
Category
Article
ISSN
0921-5107

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Chemico-Physical Characterization of Qui
Chemico-Physical Characterization of Quinizarin Thin Films Deposited by Evaporation
✍ T.Ben Nasrallah; J.C. Bernede; A. Godoy; C. Rabiller; D. Legoff πŸ“‚ Article πŸ“… 1993 πŸ› Elsevier Science 🌐 English βš– 678 KB

Quinizarin (1,4-DHAQ) thin films deposited under vacuum were invesligated by IR absorption, X-ray diffraction, nuclear magnetic resonance (NMR), optical absorption, electron spectroscopy for chemical analysis elemental analysis (XPS), and scanning electron microscopy and melting point measurements.