Microstructural Characterization of Lamellar Features in TiAl by FIB Imaging

✍ Scribed by Dennis Peter; Gunther Eggeler; Martin Franz-Xaver Wagner

• Publisher: John Wiley and Sons
• Year: 2010
• Tongue: English
• Weight: 587 KB
• Volume: 12
• Category: Article
• ISSN: 1438-1656
• DOI: 10.1002/adem.200900339