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Microstructural characterization of electron beam-physical vapor deposition thermal barrier coatings through high-resolution computed microtomography

✍ Scribed by Anand Kulkarni; Herbert Herman; Francesco DeCarlo; Ramesh Subramanian


Book ID
107440568
Publisher
The Minerals, Metals & Materials Society
Year
2004
Tongue
English
Weight
772 KB
Volume
35
Category
Article
ISSN
1073-5623

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The effects of substrate rotation speed during deposition of an Y 2 O 3 stabilized ZrO 2 (YSZ) layer fabricated by electron beam physical vapor deposition (EB-PVD) on the microstructure, elastic modulus and lifetime were investigated. The microstructure and elastic modulus of EB-PVD YSZ coatings wer