Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δthin films prepared by a dip-coating process

✍ Scribed by P. Lenormand; A. Lecomte; C. Laberty-Robert; F. Ansart; A. Boulle

• Publisher: Springer
• Year: 2007
• Tongue: English
• Weight: 721 KB
• Volume: 42
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1007/s10853-006-0560-3