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Microscopic study of recrystallized silicon carbide

โœ Scribed by T. P. Nikitina; N. E. Filonenko


Book ID
112506219
Publisher
Springer US
Year
1967
Tongue
English
Weight
927 KB
Volume
8
Category
Article
ISSN
1573-9139

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By the use of transmission electron microscopy of thin copper foils, direct evidence has been found of twinning dislocations and of their association with recrystallization twins. Although several properties of recrystallization twins can be explained on the basis of these dislocations, the origin o