Microscopic properties of passive films on Ti and Zr from optical, electrochemical and SXM-measurements

✍ Scribed by M. Schweinsberg; S. Kudelka; A. Michaelis; J. W. Schultze

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: German
• Weight: 327 KB
• Volume: 49
• Category: Article
• ISSN: 0947-5117
• DOI: 10.1002/(sici)1521-4176(199803)49:3<161::aid-maco161>3.0.co;2-p