✦ LIBER ✦
Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors
✍ Scribed by S. Lazanu; I. Lazanu; M. Bruzzi
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 536 KB
- Volume
- 514
- Category
- Article
- ISSN
- 0168-9002
No coin nor oath required. For personal study only.