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Microscopic modeling of hole inversion layer mobility in unstrained and uniaxially stressed Si on arbitrarily oriented substrates

✍ Scribed by A.T. Pham; C. Jungemann; B. Meinerzhagen


Book ID
108271664
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
429 KB
Volume
52
Category
Article
ISSN
0038-1101

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