✦ LIBER ✦
Microscopic mapping of specific contact resistances and long-term reliability tests on 4H-silicon carbide using sputtered titanium tungsten contacts for high temperature device applications
✍ Scribed by Lee, S.-K.; Zetterling, C.-M.; Ostling, M.
- Book ID
- 111909932
- Publisher
- American Institute of Physics
- Year
- 2002
- Tongue
- English
- Weight
- 586 KB
- Volume
- 92
- Category
- Article
- ISSN
- 0021-8979
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