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Microscopic evaluation of contaminants in ultra-high purity copper

✍ Scribed by E. W. Hoppe; E. E. Mintzer; C. E. Aalseth; D. J. Edwards; O. T. Farmer; J. E. Fast; D. C. Gerlach; M. Liezers; H. S. Miley

Book ID: 106441162
Publisher: Springer
Year: 2009
Tongue: English
Weight: 402 KB
Volume: 282
Category: Article
ISSN: 1588-2780
DOI: 10.1007/s10967-009-0241-1

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