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Microscopic defects on MBE grown LWIR Hg1−xCdxTe material and their impact on device performance

✍ Scribed by P. S. Wijewarnasuriya; M. Zandian; D. B. Young; J. Waldrop; D. D. Edwall; W. V. Mclevige; D. Lee; J. Arias; A. I. D’Souza


Book ID
107457864
Publisher
Springer US
Year
1999
Tongue
English
Weight
698 KB
Volume
28
Category
Article
ISSN
0361-5235

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