✦ LIBER ✦
Microscopic defect level characterization of semi-insulating compound semiconductors by TSC and PICTS: Application to the effect of hydrogen in CdTe
✍ Scribed by M. Hage-Ali; B. Yaacoub; S. Mergui; M. Samimi; B. Biglari; P. Siffert
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 296 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0169-4332
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