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Microscopic analysis of interface structure in InGaAs/InP MQW using Pendellösung oscillation around a satellite peak in high-resolution X-ray diffraction

✍ Scribed by M. Takemi; T. Kimura; K. Mori; K. Goto; Y. Mihashi; S. Takamiya


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
666 KB
Volume
82-83
Category
Article
ISSN
0169-4332

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