✦ LIBER ✦

Microscope Design: A Bottom-Up Approach : How Design Criteria Affect a Scanning Probe Microscope

✍ Scribed by Stephan Stücklin

Book ID: 102866557
Publisher: Wiley (John Wiley & Sons)
Year: 2006
Weight: 525 KB
Volume: 8
Category: Article
ISSN: 1439-4243
DOI: 10.1002/imic.200790029

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✦ Synopsis

How Design Criteria Affect a Scanning Probe Microscope

Most commercial scanning probe microscopes (SPM) are top-down descendants of the first ultrahigh vacuum devices developed at the IBM research labs in Switzerland and still retain much of their involved, cumbersome feel. This article presents a bottom-up approach by a company that made ease-of-use and accessibility their starting point.

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