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Microscale Fracture Toughness of Bismuth Doped Copper Bicrystals Using Double Edge Notched Microtensile Tests

✍ Scribed by McLean, M. J.; Wade, C. A.; Watanabe, M.; Vinci, R. P.


Book ID
121593840
Publisher
Sage Publications
Year
2013
Tongue
English
Weight
244 KB
Volume
54
Category
Article
ISSN
0014-4851

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