Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001)

✍ Scribed by Lastras-Martínez, L. F. ;Castro-García, R. ;Balderas-Navarro, R. E. ;Lastras-Martínez, A.

• Book ID: 115354662
• Publisher: The Optical Society
• Year: 2009
• Tongue: English
• Weight: 520 KB
• Volume: 48
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.48.005713