Microprocessor-based system for measurement of conductivity in amorphous semiconductors
β Scribed by A.H.G. El-Dhaher; T.S. Hassan; J.A. Safar
- Publisher
- Elsevier Science
- Year
- 1986
- Weight
- 818 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0745-7138
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Electroluminescence semiconductor optrodes (EJ\_SOs), electrochemical optical sensor systems based on recording the electroluminescence response from semiconductor electrodes, have been proposed for the detection and analysis of chemical species in solution. The possibility of developing an ELSO sen
This paper primarily focuses on detecting electrical faults in turbine generator sets by monitoring torsional vibrations with the help of the non-contact measurement technique and analysing the data acquired from torsional vibration meter. Torsional vibrations in shaft trains can be excited by perio
In this paper, we describe adaptation techniques for a hierarchically organized multi-agent-system (MAS) applied to production control of complex job shops. The system architecture of the production control system is based on three different control layers. The mid layer implements a distributed shi