Micro/nano X-ray tomography reconstruction fine-tuning using scanning electron microscope images

✍ Scribed by Ostadi, H.; Jiang, K.; Prewett, P.D.

• Book ID: 114461411
• Publisher: The Institution of Engineering and Technology
• Year: 2008
• Tongue: English
• Weight: 301 KB
• Volume: 3
• Category: Article
• ISSN: 1750-0443
• DOI: 10.1049/mnl:20080030