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Micro/minifrac test procedures and interpretation for in situ stress determination

✍ Scribed by P. De Bree; J.V. Walters


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
561 KB
Volume
26
Category
Article
ISSN
0148-9062

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The determination of the stress/strain level in diamond films was carried out here by polarized Raman spectroscopy. For as-grown polycrystalline films, a classical shift and splitting of the Raman spectra was evidenced. A polarized Raman study in two directions allowed confirming the isotropic biaxi